Improvement of Step-gauss Adc Stochastic Test Method
نویسندگان
چکیده
Improvement of Analog-to-Digital Converters testing method that is suitable for testing of high-resolution AD converters (e.g. Σ-∆ or dither-based) or on the contrary ultra high-speed AD converters is presented. The method is based on the histogram test driven by stochastic signal with defined probability density function. By repeating of the test for different settings of band-pass filter that is inserted to the input testing signal path it is possible to obtain an estimation of frequency dependency of effective number of bits. The results have to be recalculated to equivalent band-pass filtering. Practical demonstration confirmed wider applicability than for direct band-pass filter application.
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